Dr. Kevin Kimberlin has been a member of the department since 1998. Before coming to Bradley he was a Research Associate at North Carolina State University. He earned the Ph.D. at Iowa State University where he did his thesis in Low Temperature Resistance in Ultrathin Metallic Films on the Si(111) Surface with Dr. Michael Tringides. His surface physics laboratory includes an ultrahigh vacuum system that uses Reflective High Energy Electron Diffraction to analyze the surface structure of ultrathin films. Kevin has been working with undergraduate students on these studies.
Dr. Kimberlin Discusses His Research ...
My research interests lie in the structural and electronic properties of metallic layers on a surface that are less than two atoms in thickness. The area of nanoelectronics seeks to understand how a few atoms might be placed to make electronic devices whose dimensions are near the atomic size level. One important characteristic which is important in electronic devices is electrical conductivity, which is very different for a few atoms than it is for bulk materials. In the laboratory, I am setting up an electrical conductance measurements and an electron diffraction measurement (RHEED, Reflective High energy Electron Diffraction), so structural information and electronic information can simultaneously be measured as the structures are made. The next experiments with this system will be silver films deposited by Molecular Beam Epitaxy onto a silicon surface held at 100K in ultrahigh vacuum. In this system, there are some intriguing structural developments due to quantum confinement of electrons in the metallic film.
CURRICULUM VITA
Education
1988-94 Iowa State University, Ames, Iowa
Ph.D. in Physics, December 1994
Dissertation: Flux Dependence of Resistance in Ultrathin Films of Metals
on Si(111)
1983-87 Southwest Missouri State University, Springfield,
Missouri
Bachelor of Science in Physics, May 1987
Research Experience
2004 Associate Professor, Physics Department, Bradley University
1998-2004 Assistant Professor, Physics
Department, Bradley University
Research in Ultrathin Film Conductance and Structure of Ultrathin Films
Building an UHV Reflective High Energy Electron Diffraction System for
studyof conductance of
ultrathin metallic films. Vigorously seeking funding for UHV Scanning Tunneling
Microscopy laboratory,
large part of which is to funded from University level.
1996-98 Post Doctoral Research Associate, Engineering
Research Center for Advanced Electronic Materials Processing,
North Carolina State University, Raleigh, North Carolina
Research topics: Single Wafer Processing, MOSFET fabrication process development,
Metal Gate MOSFET devices.
Position includes responsibility for maintenance and operation of clustertool
laboratory while conducting
research in semiconductor processing development for industry, specifically,
metallic alloy gate development
and integration of SiGe processing into clustertool for MOSFET gate electrode,
with participation in several
other device development projects. Supervise laboratory personnel and direct
graduate students in pursuit of
degrees, as well as undergraduate students in class projects.
1995 Research
Associate, Ames Laboratory, Ames, Iowa
Research topic: Low Temperature Resistance in Ultrathin Metallic Films
on the Si(111) Surface
Position was a continuation of graduate work. Developed techniques in low
temperature UHV systems and
MBE improvements.
1989-94 Graduate Research Assistant, Department of
Physics and Ames Laboratory,Iowa State University,
Ames, Iowa
(1991-94) Research topics: Ultrathin Metal Film Resistance Study
on the Si(111) Surface, Micromachined Field Emitter
Characterization, and
(1989-91) Powder X-ray Diffraction Study of Bi-Sr-Ca-Cu-O High
Temperature Superconductor System
Graduate work toward dissertation. Developed use of UHV techniques and
gained extensive experience in
design, construction and maintenance of UHV systems. Designed in-situ ultrathin
film resistance measurement
technique and in-house MBE sources in measurement of ultrathin film conductance
study. Additional projects
include characterization and testing of novel field emitter designs for
use in flat panel television display for
AMOCO Corp. and the use of X-ray diffraction and scanning electron microscopy
techniques in characterizing
the phase diagram for amorphous fibers in the Bi-based high temperature
superconductor system.
1985-87 Research and Design Assistant for Advanced
Technologies division, DAYCO Corporation,
Springfield, Missouri
Worked on various projects, encompassing R&D, product quality control,
and use of testing equipment to test
dynamic endurance of new polymer formulations. Worked with engineers
in the corporate environment.
Teaching Experience
1998 - Assistant Professor,
Bradley University
Lecturer of introductory courses, calculus and non-calculus based with
laboratory, science and non-science
majors, including Astronomy and Physical Science. Lecturer in junior level
Electromagnetism, a two semester
course. Advised students in research (for credit) in Surface Physics.
1995-96 Lecturer, Department of Physics, Iowa
State University, Ames, Iowa
Lecturer of the calculus based physics course for physics and engineering
majors, including course planning,
evaluation and overseeing the course in general. Also served in capacity
as instructor in laboratory courses.
1988-90 Teaching Assistant, Department of Physics,
Iowa State University, Ames, Iowa
Recitation and laboratory instruction and evaluation of undergraduate science,
engineering, and
nonscience majors.
Memberships
L. Gavioli, K.R. Kimberlin*, M.C. Tringides, J.F. Wendeken, Z. Zhang, Scanning Tunneling Microscopy and In-situ Conductivity in Low Temperature Growth of Ag(111) System, Phys. Rev. Lett. 82(1) 1999.
K.R. Kimberlin and M.C. Tringides, Flux Dependence of In-situ Transport Measurements for Ag on Si(111)-7x7, J. Vac. Sci. Tech. A 13(2) (1995).
M.C. Tringides, p. Seymour, K.R. Jacobs, H.H. Busta, and J.D. Pogemiller, Single Micromachined Emitter Characteristics, J. Vac. Sci. Tech. B 11(2) (1993) 396-399.
K.R. Jacobs, T.A. Miller, A.I. Goldman, D.K. Finnemore, R.A. Gleixner, J. Righi, and D. Zeigler, Environmental Contamination of Amorphous Bi-Sr-Ca-Cu-O Fibers., J. Supercond. 4(4) (1991) 311-313.
K.R. Jacobs, T.A. Miller, D.K. Finnemore, A.I. Goldman, S.e. LeBeau, and J. Righi, Crystallization of the Bi2Sr2Ca-Cu2-Ox Superconducting Filaments Produced by Gas-Jet Fiberization, IEEE Transactions of Magnetics, 27(1991) 917-919.
Contributed Papers
Recent Innovations in Bradley University's Computer-Based Introductory Laboratories, C. Stutz, D. Early, K.R. Kimberlin, K.R. Roos, Summer Conference AAPT, Guelph, Ontario, July 20-Aug. 1, 2000.
A New Tenure-Track Faculty Member in an Aging Physics Department, K.R. Kimberlin, Winter Conference AAPT, Kissimmee, FL, January 15-19, 2000
K.R. Kimberlin, Kelly Roos, Michael Tringides, Films of Double-Step Heights Observed with RHEED During Growth of Ag/Si(111)-7x7 at Low Temperatures, Bulletin of the American Physical Society, 44 (1999).
Luca Gavioli, Kevin R. Kimberlin, Michael C. Tringides, John F. Wendelkin, Zhenyu Zhang, Correlations Between Morphology and Transport Properties of Ag Overlayers on Si(111), Bulletin of the American Physical Society (1998).
William J. Kiether, Kevin R. Kimberlin, J.R. Hauser, Survey of Deposition Uniformity in an Edge-Heated RTCVD System, Minerals, Metals, and Materials Society Annual Meeting (TMS), San Antonio, Texas, February 15-19, 1998.
K.R. Roos, K.R. Kimberlin, M. Stanley, U. Koehler, M.C. Tringides, RHEED and In-situ Resistivity Characterizatin of Ultrathin Ag/Si(111) Films at Low Temperatures, Bulletin of the American Physical Society 41(1996).
K.R. Kimberlin, K.R. Roos, M. Stanley, U. Koehler, M.C. Tringides, RHEED and In-situ Resistivity Characteristics of Ultrathin Ag/Si(111) Films at Low Temperature, 42nd National Symposium of the American Vacuum Society, Minneapolis, Minnesota, October 16-20, 1995.
K.R. Kimberlin and M.C. Tringides, Two Dimensional vs. Three Dimensional Conductance in the Ag/Si(111) System, Spring Meeting of the Illinois Chapter of the American Vacuum Society, Milwaukee, Wisconsin, May 25, 1995.
K.R. Jacobs and M.C. Tringides, Electrical Transport in Ultrathin Films in the Ag/Si(111) System, Bulletin of the American Physical Society 39(1994) 141.
K.R. Roos, K.R. Jacobs, and M.C. Tringides, Flux Dependence of Morphology and Electrical Resistivity in Ultra-Thin Ag/Si(111) Films, Bulletin of the American Physical Society 38 (1993) 625.
K.R. Jacobs, K.R. Roos, and M.C. Tringides, Electrical Transport and Morphology in Ultrathin Ag/Si(111) Films, Spring Meeting of the Illinois Chapter of the American Vacuum Society, Evanston, Illinois, April 30, 1993.
K.R. Jacobs, P. Seymour, and M.C. Tringides, Characteristics of Micromachined Lateral Field Emission Tips, 39th National Symposium of the American Vacuum Society, Chicago, Illinois, November 9-13, 1992.
K. Jacobs, P. Seymour, and M.C. Tringides, Emission Characteristics of Micromachined Lateral Thin Film Field Emission Tips, Bulletin of the American Physical Society 37 (1992) 168.
K. Jacobs, A.I. Goldman, T.A. Miller, J. Righi, and S. LeBeau, Crystallization of Bi2Sr2Ca-Cu2-Ox Superconducting Amorphous Filaments, Applied Superconductivity Conference, Snowmass, Colorado (1990).
K. Jacobs, A.I. Goldman, T.A. Miller, J. Righi, and S. LeBeau,
Intermediate
Phases During the Crystallization of Amorphous Bismuth Cuprate, Bulletin
of the American Physical Society 35 (1990) 588.
*Name change from K. Jacobs, 1995